Effect of Au spacer layer on L10 phase ordering temperature of CoPt thin films

Effect of Au spacer layer on L10 phase ordering temperature of CoPt thin films

Annealing temperature effect on nanostructure and phase transition of Copper Oxide thin films

This paper addresses the annealing temperature effect on nanostructure and phase transition of copper oxide thin films, deposited by PVD method on glass substrate (at 110 nm thickness) and post annealed at different temperatures (200-400°C) with a flow of 1 cm3s-1 Oxygen. The X-ray diffraction (XRD) was employed for crystallographic and phase analyses, while atomic force m...

Annealing temperature effect on nanostructure and phase transition of Copper Oxide thin films

This paper addresses the annealing temperature effect on nanostructure and phase transition of copper oxide thin films, deposited by PVD method on glass substrate (at 110 nm thickness) and post annealed at different temperatures (200-400°C) with a flow of 1 cm3s-1 Oxygen. The X-ray diffraction (XRD) was employed for crystallographic and phase analyses, while atomic force m...

Magnetoelectric Effect in L10-CoPd Thin Films

Structure and magnetic properties of L10 CoPt„AgÕMgO,MgO... thin films

Disordered fcc ~face-centered-cubic! @100# fiber-textured CoPt thin films with thicknesses of 20–40 nm were deposited on a nonmagnetic sputtered MgO seed layer with and without a Ag intermediate layer. These were subsequently annealed at 600–750 °C for 5–10 min using rapid thermal annealing ~RTA!. The structural variants were determined to coexist in the in-plane and normal to the plane directi...